TUXERA + NplusT: a unique team. All software components and system level optimization for highest reliability.
All-in-One Instrument with breakthrough cycling performance to evaluate emerging non-volatile memory technologies in reasonable time.
World’s fastest, affordable, task optimized NAND characterization equipment, to understand array performance and reliability, power profile and timing/signal integrity.
Live recording of NplusT’s presentation during the “Finding the way of solving reliability issues of the next generation NAND flash memories” workshop, organized by CCF YOCSEF Shanghai (China Computer Federation, Young Computer Scientists Engineers Forum), held December 18, 2021.
SSD developers spend significant effort behind lower-than-planned QoS and unexpected crashes. Many of these issues are due to incorrect hardware and firmware management of the NAND devices, not facing correctly the challenges of the latest NAND technologies and interface speeds. NAND characterization, executed correctly, reduces the reworks during SSD prototyping and ensures reliable, high-performance products. NplusT’s NanoCycler offers a one-stop solution to collect and analyze all NAND related information.
Device manufacturers who rely on NAND, such as SSDs, memory modules, storage electronics, cannot forgo efficient NAND characterization. This webinar provides an insight on how understanding the NAND is central to the memory manufacturing process, and on how to efficiently tackle and solve reliability and performance issues using NplusT’s NanoCycler.
A case study what information BarnieMAT can extract from characterization data, related to a programming algorithm.
This video provides a short overview about features and capabilities of NanoCycler, equipment developed especially for NAND characterization, essential to build high performance reliable SSDs and mass storage devices.