NplusT took part in the workshop titled “Finding the way of solving reliability issues of the next generation NAND flash memories”, organized by CCF YOCSEF Shanghai (China Computer Federation, Young Computer Scientists Engineers Forum) and held the December 18, 2021.

The meeting was a great occasion to exchange experience and ideas by several industry and academic experts.
Tamas Kerekes presented the paper “NAND Characterization for ONFI5 and Beyond”. The integral version is available at this link.