A prestigious European research center has selected NplusT’s TESTMESH TMC-100 for the advanced characterization of neuromorphic computational arrays based on emerging non-volatile technology. The exceptional speed and precision of the TMC-100, operating at hundreds of times faster than competitors, was a key factor in their decision.
This new installation marks the continuation of over 10 years of collaboration, and we are thrilled to further strengthen our partnership.
NplusT’s technology was recently featured in a research publication and played a critical role in enabling precise data collection and testing. Using NanoCycler as core tool for acquiring real-device data during the entire NAND life cycle, Luo Zheng’s dissertation, titled “Research and Development of Efficient Testing Technology for Ultra-large Capacity 3D Flash Memory”, delves into enhancing the reliability and lifespan of 3D NAND flash memory.
Written under the guidance of Prof. Han Guojun at the Department of Electronic Information, Guangdong University of Technology, in Guangzhou, China, the research focuses on developing machine learning models to accurately predict flash memory lifespan. The work aims to optimize storage system performance by reducing the impact of noise on lifespan prediction accuracy.
The NplusT team extends their congratulations to Luo Zheng for earning the degree of Master of Electronic Information.
